TY  - CONF
AU  - Wohlwend, Harvey
AU  - Crispieri, Gino
AU  - Li-Baboud, Ya-Shian
C2  - AEC/APC Symposium-Asia, Taipei, 1, TW
DA  - 2006-11-30 00:11:00
LA  - en
PB  - AEC/APC Symposium-Asia, Taipei, 1, TW
PY  - 2006
TI  - Advancing Factory-Wide Data Quality for APC Applications
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32533
ER  -