TY  - JOUR
AU  - Postek, Michael
AU  - Keery, William
AU  - Frederick, Nolan
C2  - Review of Scientific Instruments
DA  - 1990-06-01 00:06:00
LA  - en
M1  - 61
PB  - Review of Scientific Instruments
PY  - 1990
TI  - Low-Profile High-Efficiency Microchannel-Plate Detector System for Scanning Electron Microscopy Applications
ER  -