TY  - GEN
AU  - Oettinger, Frank
AU  - Blackburn, David
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-07-01 00:07:00
LA  - en
M1  - 400
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - Semiconductor Measurement Technology: Thermal Resistance Measurements
ER  -