TY  - JOUR
AU  - Suehle, John
AU  - Chaparala, P
C2  - IEEE Transactions on Electron Devices
DA  - 1997-05-01 00:05:00
LA  - en
M1  - 44
PB  - IEEE Transactions on Electron Devices
PY  - 1997
TI  - Low Electric Field Breakdown of Thin SiO<sub>2</sub> Films under Static and Dynamic Stress
ER  -