TY  - CONF
AU  - Mayo, Santos
AU  - Lowney, J
AU  - Roitman, Peter
C2  - Proc., 1991 IEEE International SOI Conference, Vail Valley, CO, USA
DA  - 1991-12-31 00:12:00
LA  - en
PB  - Proc., 1991 IEEE International SOI Conference, Vail Valley, CO, USA
PY  - 1991
TI  - Measurement of Interface Defects in Gated SIMOX Structures
ER  -