TY  - CONF
AU  - Jeffery, Anne-Marie
AU  - Lee, Lai
AU  - Shields, John
C2  - Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC
DA  - 1999-04-01 00:04:00
LA  - en
M1  - 48
PB  - Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC
PY  - 1999
TI  - Model Tests to Investigate the Effects of Geometrical Imperfections on the NIST Calculable Capacitor
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=2757
ER  -