TY  - CONF
AU  - Berning, David
AU  - Jr., Allen Hefner
C2  - Proc., IEEE Industry Applications Society (IAS) Annual Meeting, San Diego, CA, USA
DA  - 1996-12-31 00:12:00
LA  - en
M1  - 3
PB  - Proc., IEEE Industry Applications Society (IAS) Annual Meeting, San Diego, CA, USA
PY  - 1996
TI  - IGBT Half-Bridge Shoot-Through Characterization for Model Validation
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=25158
ER  -