TY - CONF AU - Suehle, John AU - Xiong, Hao AU - Gurfinkel, Moshe C2 - Nano and Giga Challenges in Electronics and Photonics, Phoenix, AZ, USA DA - 2007-03-14 00:03:00 LA - en PB - Nano and Giga Challenges in Electronics and Photonics, Phoenix, AZ, USA PY - 2007 TI - Reliability and Characterization Challenges for Nano-Scale Electronic Devices UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32607 ER -