TY  - CONF
AU  - Diebold, Alain
AU  - Wollman, David
AU  - Irwin, Kent
AU  - Martinis, John
AU  - Liu, B.
C2  - Proc., Fourth Intl. Symp. on Ultra Clean Processing of Silicon Surfaces (UCPSS'98), Ostend, 1, SW
DA  - 1998-09-01 00:09:00
LA  - en
PB  - Proc., Fourth Intl. Symp. on Ultra Clean Processing of Silicon Surfaces (UCPSS'98), Ostend, 1, SW
PY  - 1998
TI  - Application of Microcalorimeter EDS X-Ray Detectors to Particle Analysis
ER  -