TY  - GEN
AU  - Seiler, David
AU  - Shaffner, Thomas
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1995-11-01 00:11:00
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1995
TI  - International Workshop on Semiconductor Characterization: Present Status and Future Needs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=27247
ER  -