TY  - CONF
AU  - Prendergast, J.
AU  - Suehle, John
AU  - Chaparala, P
AU  - Murphy, E.
AU  - Stephenson, M.
C2  - Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA
DA  - 1995-12-31 00:12:00
LA  - en
PB  - Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA
PY  - 1995
TI  - TDDB Characterization of Thin SiO<sub>2</sub> Films With Bimodal Failure Populations
ER  -