TY  - CONF
AU  - Krupka, Jerzy
AU  - Geyer, Richard
AU  - Cros, D.
C2  - Proc., Intl. Microwave Conf. MIKON, Ksi, 1, PL
DA  - 1994-06-01 00:06:00
LA  - en
PB  - Proc., Intl. Microwave Conf. MIKON, Ksi, 1, PL
PY  - 1994
TI  - Use of Higher-Order TEo k Modes in Dielectric Measurements of Dielectric Rod Resonators
ER  -