TY  - JOUR
AU  - Kim, Jin
AU  - Seiler, David
AU  - Lancaster, R.
AU  - Reine, M.
C2  - Journal of Electronic Materials
DA  - 1996-12-31 00:12:00
LA  - en
M1  - 25
PB  - Journal of Electronic Materials
PY  - 1996
TI  - Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements
ER  -