TY  - CONF
AU  - Suehle, John
AU  - Chaparala, P
C2  - Proc., Materials Research Society Symposium, Pittsburgh, PA, USA
DA  - 1995-12-31 00:12:00
LA  - en
PB  - Proc., Materials Research Society Symposium, Pittsburgh, PA, USA
PY  - 1995
TI  - Time-Dependent Dielectric Breakdown in Thin Intrinsic SiO<sub>2</sub> Films
ER  -