TY  - JOUR
AU  - Elmquist, Randolph
AU  - Dziuba, Ronald
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1997-04-01 12:04:00
LA  - en
M1  - 46
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1997
TI  - Loading Effects in Resistance Scaling
ER  -