TY  - JOUR
AU  - Dziuba, Ronald
AU  - Elmquist, Randolph
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1993-04-01 00:04:00
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1993
TI  - Improvements in Resistance Scaling at NIST Using Cryogenic Current Comparators
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=313
ER  -