TY  - JOUR
AU  - Glahn, P. Von
AU  - Brunt, Richard Van
C2  - IEEE Transactions on Dielectrics and Electrical Insulation
DA  - 1995-08-01 00:08:00
LA  - en
M1  - 2
PB  - IEEE Transactions on Dielectrics and Electrical Insulation
PY  - 1995
TI  - Continuous Recording and Stochastic Analysis of PD
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=9368
ER  -