TY  - CONF
AU  - Zhu, Baozhong
AU  - Suehle, John
AU  - Chen, Y
AU  - Bernstein, J
C2  - Proc., Integrated Reliability Workshop, Lake Tahoe, CA, USA
DA  - 2002-10-21 00:10:00
LA  - en
PB  - Proc., Integrated Reliability Workshop, Lake Tahoe, CA, USA
PY  - 2002
TI  - Negative Bias Temperature Instability of Deep Sub-Micron p-MOSFETs Under Pulsed Bias Stress
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30882
ER  -