TY  - CONF
AU  - Duong, Tam
AU  - Jr., Allen Hefner
AU  - Berning, David
C2  - Proceedings of the IEEE COMPEL 2006 Workshop, Troy, NY, USA
DA  - 2006-07-01 00:07:00
LA  - en
PB  - Proceedings of the IEEE COMPEL 2006 Workshop, Troy, NY, USA
PY  - 2006
TI  - Automated Parameter Extraction Software For High-Voltage, High-Frequency SiC Power MOSFETs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32376
ER  -