TY  - JOUR
AU  - Hourdakis, Emmanouel
AU  - Wahl, J
AU  - Zimmerman, Neil
C2  - Applied Physics Letters
DA  - 2008-02-12 00:02:00
DO  - https://doi.org/10.1063/1.2841659
LA  - en
PB  - Applied Physics Letters
PY  - 2008
TI  - Lack of charge offset drift is a robust property of Si single electron transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=840905
ER  -