TY  - JOUR
AU  - Asmail, C
AU  - Hsia, J
AU  - Parr, Albert
AU  - Hoeft, J
C2  - Applied Optics
DA  - 1994-01-01 00:01:00
LA  - en
M1  - 33
PB  - Applied Optics
PY  - 1994
TI  - Rayleigh Scattering Limits for Low-Level BRDF Measurements
ER  -