TY  - JOUR
AU  - Lenahan, Patrick
AU  - Campbell, Jason
AU  - Krishnan, A.T.
AU  - Krishnan, S.
C2  - IEEE Transactions on Device and Materials Reliability
DA  - 2011-06-01 00:06:00
LA  - en
M1  - 11
PB  - IEEE Transactions on Device and Materials Reliability
PY  - 2011
TI  - A Model for NBTI in Nitrided Oxide MOSFETs Which Does Not Involve Hydrogen or Diffusion
ER  -