TY  - CONF
AU  - Simoens, Eddy
AU  - Yang, Bian
AU  - Zhou, Xuebing
AU  - Beato, Filipe
AU  - Busch, Christoph
AU  - Newton, Elaine
AU  - Preneel, Bart
C2  - Proceedings of the 5th IEEE/IAPR International Conference on Biometrics (ICB 2012) , New Delhi, IN
DA  - 2012-03-30 00:03:00
DO  - https://doi.org/10.1109/ICB.2012.6199799
LA  - en
PB  - Proceedings of the 5th IEEE/IAPR International Conference on Biometrics (ICB 2012) , New Delhi, IN
PY  - 2012
TI  - Criteria Towards Metrics for Benchmarking Template Protection Algorithms
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=910305
ER  -