TY  - JOUR
AU  - Stroscio, Joseph
AU  - Yang, H.J.
AU  - Chae, Jungseok
AU  - Baek, H.
AU  - Ha, Jeonghoon
AU  - Kuk, Young
AU  - Jung, Suyong
AU  - Song, Young
AU  - Zhitenev, Nikolai
AU  - Woo, S.J.
AU  - Son, Young-Woo
C2  - International Journal of High Speed Electronics and Systems
DA  - 2011-03-01 00:03:00
LA  - en
M1  - 20
PB  - International Journal of High Speed Electronics and Systems
PY  - 2011
TI  - Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908985
ER  -