TY  - JOUR
AU  - Kim, Jihong
AU  - Shrestha, Pragya
AU  - Campbell, Jason
AU  - Ryan, Jason
AU  - Nminibapiel, David
AU  - Kopanski, Joseph
AU  - Cheung, Kin
C2  - IEEE Transactions on Electron Devices
DA  - 2016-10-01 00:10:00
DO  - https://doi.org/10.1109/TED.2016.2586483
LA  - en
M1  - 63
PB  - IEEE Transactions on Electron Devices
PY  - 2016
TI  - Rapid and Accurate C-V Measurements
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921598
ER  -