TY  - JOUR
AU  - McCrory, Duane
AU  - Anders, Mark
AU  - Ryan, Jason
AU  - Shrestha, Pragya
AU  - Cheung, Kin
AU  - Lenahan, Patrick
AU  - Campbell, Jason
C2  - Review of Scientific Instruments
DA  - 2019-01-14 00:01:00
DO  - https://doi.org/10.1063/1.5053665
LA  - en
M1  - 90
PB  - Review of Scientific Instruments
PY  - 2019
TI  - Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926629
ER  -