TY  - JOUR
AU  - Flater, Erin
AU  - Mugdha, Arya
AU  - Gupta, Saurabh
AU  - Hudson, William
AU  - Fahrenkamp, Abbigail
AU  - Killgore, Jason
AU  - Wilson, Jesse
C2  - Measurement Science & Technology
DA  - 2020-05-29 00:05:00
LA  - en
PB  - Measurement Science & Technology
PY  - 2020
TI  - Error Estimation and Enhanced Stiffness Sensitivity in Contact Resonance Force Microscopy with a Multiple Arbitrary Frequency Lock-In Amplifier (MAFLIA)
ER  -