TY  - JOUR
AU  - Suzuki, M
AU  - Ando, H
AU  - Higashi, Yukihiru
AU  - Takenaka, H
AU  - Shimada, H
AU  - Matsubayashi, N
AU  - Imamura, M
AU  - Kurosawa, S
AU  - Tanuma, S
AU  - Powell, Cedric
C2  - Surface and Interface Analysis
DA  - 2000-05-01 00:05:00
LA  - en
M1  - 29
PB  - Surface and Interface Analysis
PY  - 2000
TI  - Experimental Determination of Electron Effective Attenuation Lengths in Silicon Dioxide Thin Films Using Synchrotron Radiation - I. Data Analysis and Comparisons
ER  -