TY  - JOUR
AU  - Jordan, C.
AU  - Stranick, Stephan
AU  - Richter, Lee
AU  - Cavanagh, Richard
C2  - Journal of Applied Physics
DA  - 1999-09-01 00:09:00
LA  - en
M1  - 86
PB  - Journal of Applied Physics
PY  - 1999
TI  - Removing Optical Artifacts in Near-Field Scanning Optical Microscopy by Using a Three Dimensional Scanning Mode
ER  -