TY  - CONF
AU  - Richter, Curt
AU  - Seiler, David
AU  - Pellegrino, Joseph
AU  - Tseng, W.
AU  - Thurber, W.
C2  - Semiconductor Characterization -  Present Status and Future Needs, Gaithersburg, MD, USA
DA  - 1995-12-31 00:12:00
LA  - en
PB  - Semiconductor Characterization -  Present Status and Future Needs, Gaithersburg, MD, USA
PY  - 1995
TI  - Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices
ER  -