TY  - CONF
AU  - Shen, Chien-Chung
AU  - Jr., Allen Hefner
AU  - Berning, David
AU  - Bernstein, J
C2  - Proc.,  IEEE Industry Applications Society (IAS) Annual Meeting, St. Louis, MO, USA
DA  - 1998-12-31 00:12:00
LA  - en
PB  - Proc.,  IEEE Industry Applications Society (IAS) Annual Meeting, St. Louis, MO, USA
PY  - 1998
TI  - Failure Dynamics of the IGBT During Turn-Off for Unclamped Inductive Loading Conditions
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3393
ER  -