TY  - SER
AU  - Kopanski, Joseph
AU  - Thurber, W.
AU  - Chun, Melissa
C2  - Electrochemical Society, Pennington, NJ
DA  - 2006-07-01 00:07:00
LA  - en
PB  - Electrochemical Society, Pennington, NJ
PY  - 2006
TI  - Characterization of the silicon dioxide-silicon interface with the scanning capacitance microscope
ER  -