TY  - CONF
AU  - Smith, S
AU  - Lindsay, I.
AU  - Walton, Anthony
AU  - Cresswell, Michael
AU  - Linholm, Loren
AU  - Allen, Richard
AU  - Fallon, M.
AU  - Gundlach, Alan
C2  - Proc., IEEE International Conference on Microelectronic Test Structures, Goteborg, 1, SW
DA  - 1999-06-01 00:06:00
LA  - en
PB  - Proc., IEEE International Conference on Microelectronic Test Structures, Goteborg, 1, SW
PY  - 1999
TI  - Analysis of Current Flow in Mono-Crystalline Electrical Linewidth Structures
ER  -