TY  - CONF
AU  - Ortiz-Rodriguez, Jose
AU  - Jr., Allen Hefner
AU  - Berning, David
AU  - Hood, Colleen
AU  - Olcum, S.
C2  - Proceedings of the IEEE COMPEL Workshop 2006, Troy, NY, USA
DA  - 2006-07-01 00:07:00
LA  - en
PB  - Proceedings of the IEEE COMPEL Workshop 2006, Troy, NY, USA
PY  - 2006
TI  - Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32380
ER  -