TY  - ICOMM
AU  - Koning, R
AU  - Dixson, Ronald
AU  - Fu, Joseph
AU  - Tsai, V
AU  - Vorburger, Theodore
C1  - http://www.nist.gov/sigmaxi/Posters98/abs/Koning.html
C2  - Performing measurements of surface structures with the Calibrated Atomic Force Microscope
DA  - 1998-01-01 00:01:00
LA  - en
PB  - Performing measurements of surface structures with the Calibrated Atomic Force Microscope
PY  - 1998
TI  - Performing Measurements of Surface Structures With the Calibrated Atomic Force Microscope
ER  -