TY  - JOUR
AU  - Maitland, T
AU  - Han, X
AU  - Vaudin, Mark
AU  - Fox, G
AU  - Coy, M
C2  - Ultramicroscopy
DA  - 2021-10-12 15:10:23
LA  - en
PB  - Ultramicroscopy
PY  - 2021
TI  - Electron Backscatter Diffraction Investigation of a Nano-Crystalline Pt Thin Film
ER  -