TY  - CONF
AU  - Gu, Xiaohong
AU  - VanLandingham, Mark
AU  - Fasolka, Michael
AU  - Martin, Jonathan
AU  - Jean, J
AU  - Nguyen, Tinh
C2  - Proceedings of the 26th Annual Meeting of the Adhesion Society
DA  - 2003-02-26
LA  - en
PB  - Proceedings of the 26th Annual Meeting of the Adhesion Society
PY  - 2003
TI  - Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860482
ER  -