TY  - JOUR
AU  - Chen, W
AU  - Gentile, Thomas
AU  - O'donovan, K
AU  - Borchers, J
AU  - Majkrzak, C
C2  - Review of Scientific Instruments
DA  - 2004-01-01 00:01:00
LA  - en
M1  - 75
PB  - Review of Scientific Instruments
PY  - 2004
TI  - Polarized Neutron Reflectometry of w Patterned Magnetic Film with w <sup>3</sup>He Analyzer and a Position Sensitive Detector
ER  -