TY  - CONF
AU  - Flournoy, T
AU  - Eppeldauer, George
C2  - NCSL International 2003 Workshop and Symposium Conference Proceedings | | The Spectrum of Metrology: From the State of the Art to the Everyday |, Undefined
DA  - 2021-10-12 15:10:23
LA  - en
PB  - NCSL International 2003 Workshop and Symposium Conference Proceedings | | The Spectrum of Metrology: From the State of the Art to the Everyday |, Undefined
PY  - 2021
TI  - Improved Facility for Optical Detector Characterization
ER  -