TY  - JOUR
AU  - Witczak, S
AU  - Schrimpf, R
AU  - Galloway, K
AU  - Fleetwood, D
AU  - Pease, R
AU  - Puhl, James
AU  - Schmidt, D
AU  - Combs, W
AU  - Suehle, John
C2  - IEEE Transactions on Nuclear Science
DA  - 1996-01-01 00:01:00
LA  - en
M1  - 43
PB  - IEEE Transactions on Nuclear Science
PY  - 1996
TI  - Accelerated Tests for Simulating Low Dose Rate Gain Degradation of Lateral and Substrate PNP Bipolar Junction Transistors
ER  -