TY  - JOUR
AU  - Imtiaz, Atif
AU  - Baldwin, Thomas
AU  - Nembach, Hans
AU  - Wallis, Thomas
AU  - Kabos, Pavel
C2  - Applied Physics Letters
DA  - 2007-06-12
LA  - en
M1  - 90
PB  - Applied Physics Letters
PY  - 2007
TI  - Near-field microwave microscope measurements to characterize bulk material properties
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32646
ER  -