TY  - CONF
AU  - Brodsky, Alexander
AU  - Shao, Guodong
AU  - Krishnamoorthy, Mohan
AU  - Narayanan, Anantha
AU  - Menasce?, Daniel
AU  - Ak, Ronay
C2  - Proceedings  of the  IEEE International Conference on Big Data (IEEE BigData 2015), Santa Clara, CA, US
DA  - 2015-11-01 00:11:00
LA  - en
PB  - Proceedings  of the  IEEE International Conference on Big Data (IEEE BigData 2015), Santa Clara, CA, US
PY  - 2015
TI  - Analysis and Optimization in Smart Manufacturing based on a Reusable Knowledge Base for Process Performance Models
ER  -