TY  - JOUR
AU  - Shang, Ju
AU  - Moody, Michael
AU  - Chen, Jiazhen
AU  - Krylyuk, Sergiy
AU  - Davydov, Albert
AU  - Marks, Tobin
AU  - Lauhon, Lincoln
C2  - ACS Applied Electronic Materials
DA  - 2020-04-21 00:04:00
LA  - en
M1  - 2
PB  - ACS Applied Electronic Materials
PY  - 2020
TI  - In situ transport measurements reveal source of mobility enhancement of MoS2 and MoTe2 during dielectric deposition
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929793
ER  -