TY  - GEN
AU  - Chiao, J
AU  - Goldman, Julian
AU  - Heck, David
AU  - Kazanzides, Peter
AU  - Peine, William
AU  - Stiehl, James
AU  - Yen, Dwight
AU  - Dagalakis, Nicholas
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2008-04-30 00:04:00
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2008
TI  - Metrology and Standards Needs of Some Categories of Medical Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823042
ER  -