TY  - JOUR
AU  - Wu, Wen-Li
AU  - Wallace, William
AU  - Lin, Eric
AU  - Lynn, G
AU  - Glinka, Charles
AU  - Ryan, E
AU  - Ho, H
C2  - Journal of Applied Physics
DA  - 2000-02-01 00:02:00
LA  - en
M1  - 87
PB  - Journal of Applied Physics
PY  - 2000
TI  - Properties of Nanoporous Silica Thin Films Determined by High-Resolution X-Ray Reflectivity and Small-Angle Neutron Scattering
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851582
ER  -