TY  - JOUR
AU  - Davies, Matthew
AU  - Yoon, Howard
AU  - Schmitz, T
AU  - Burns, T
AU  - Kennedy, M
C2  - J Machining Sci Tech
DA  - 2003-01-01 00:01:00
LA  - en
M1  - 7
PB  - J Machining Sci Tech
PY  - 2003
TI  - Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
ER  -