TY  - CONF
AU  - Rice, Paul
AU  - Russek, Stephen
AU  - Hoinville, J
AU  - Kelley, Michael
C2  - Proceedings of the Fourth Workshop on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, US
DA  - 1997-01-01 00:01:00
LA  - en
PB  - Proceedings of the Fourth Workshop on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, US
PY  - 1997
TI  - The NIST Magnetic Imaging Reference Sample
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620490
ER  -