TY  - JOUR
AU  - McMichael, Robert
AU  - Stiles, Mark
AU  - Chen, P
AU  - Jr., William Egelhoff
C2  - Journal of Applied Physics
DA  - 1998-01-01 00:01:00
LA  - en
M1  - 83
PB  - Journal of Applied Physics
PY  - 1998
TI  - Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620492
ER  -