TY  - CONF
AU  - Bittel, Brad
AU  - Novak, S
AU  - Ramey, Steve
AU  - Padiyar, S
AU  - Ryan, Jason
AU  - Campbell, Jason
AU  - Cheung, Kin
C2  - 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
DA  - 2016-01-14 00:01:00
LA  - en
PB  - 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
PY  - 2016
TI  - Novel Charge Pumping Method Applied to Tri-Gate MOSFETs for Reliability Characterization
ER  -