TY  - GEN
AU  - Krima, Sylvere
AU  - Jr., Thomas Hedberg
AU  - Feeney, Allison Barnard
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-02-07 00:02:00
DO  - https://doi.org/10.6028/NIST.AMS.300-6
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - Securing the Digital Threat for Smart Manufacturing: A Reference model for blockchain-based product data traceability
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926019
ER  -